Ek, M. ; Hansen, L. P. ; Chen, F. R. ; van Dyck, D. ; Kisielowski, C. ; Specht, P. ; Damsgaard, C. D. ; Jinschek, J. R. ; Helveg, S.
in: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol: 29, issue: suppl. 1
Type: Conference abstract in journal (Peer reviewed)
Status:
Published
| Year:
2023
| DOI:
https://doi.org/10.1093/micmic/ozad067.660