Publications

Controlling Thermal Gradients during in situ Transmission Electron Microscopy Heating Experiments

Yang, Yi Chieh ; Vijayan, Sriram ; Sneppen, Thor Bjerregård ; Jinschek, Joerg R.
in: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol: 29, issue: 1, pages: 130-131

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2023 | DOI: https://doi.org/10.1093/micmic/ozad067.058

Gamma Prime Characterization in Additively Manufactured Haynes 282 after One-Step and Two-Step Post-Process Heat Treatments

Mourot, Alivia ; Gupta, Avantika ; Vijayan, Sriram ; Jinschek, Joerg ; Fink, Carolin
in: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol: 29, issue: 1, pages: 1421-1422

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2023 | DOI: https://doi.org/10.1093/micmic/ozad067.731

Graphene Seals for in situ TEM in Catalysis

Bjørnlund, Anton S. ; Ambjørner, Hjalte R. ; Bonczyk, Tobias G. ; Dollekamp, Edwin ; Kaas, Lau M. ; Colding-Fagerholt, Sofie ; Mølhave, Kristian S. ; Damsgaard, Christian D. ; Helveg, Stig ; Vesborg, Peter C.K.
in: Microscopy and Microanalysis, vol: 29, issue: Suppl 1, pages: 1610-1610

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2023 | DOI: https://doi.org/10.1093/micmic/ozad067.826

On the Electron Dose-rate Dependency of Radiation Effects and Total Dose Criteria in ZIF-8 Metal-organic-framework (MOF)

Banerjee, Pritam ; Kollmannsberger, Kathrin L. ; Fischer, Roland A. ; Jinschek, Joerg R.
in: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol: 29, issue: 1, pages: 1253-1254

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2023 | DOI: https://doi.org/10.1093/micmic/ozad067.642

Probing Catalyst Surfaces at the Atomic-scale

Ek, M. ; Hansen, L. P. ; Chen, F. R. ; van Dyck, D. ; Kisielowski, C. ; Specht, P. ; Damsgaard, C. D. ; Jinschek, J. R. ; Helveg, S.
in: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol: 29, issue: suppl. 1

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2023 | DOI: https://doi.org/10.1093/micmic/ozad067.660

Automation of Supported Nanoparticle Recognition in Low Contrast STEM Images

Lützen, Mads ; Kelly, Daniel ; Smitshuysen, Thomas E. L. ; Damsgaard, Christian D.
in: Microscopy and Microanalysis, vol: 28, issue: S1, pages: 3032-3034

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2022 | DOI: https://doi.org/10.1017/S1431927622011333

Defined metal atom aggregates precisely incorporated into metal–organic frameworks

Kollmannsberger, Kathrin L. ; Kronthaler, Laura ; Jinschek, Joerg ; Fischer, Roland A.
in: Chemical Society Reviews, vol: 51, pages: 9855-9856

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2022 | DOI: https://doi.org/10.1039/D2CS90099H

Direct Visualization of Spinel-Like Rhodium Aluminate (RhAlOx) to Understand its Role in Rh/Al2O3-Based Three-Way Catalysts

Li, Cheng-Han ; Wu, Jason ; Jinschek, Joerg R.
in: Microscopy and Microanalysis, vol: 28, issue: S1, pages: 2544-2546
Presented at: Microscopy & Microanalysis 2022

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2022 | DOI: https://doi.org/10.1017/S1431927622009710

High Throughput Characterization to Quantify Microstructural Heterogeneities in Additively Manufactured Haynes 282

Gupta, Avantika ; Vijayan, Sriram ; Schmid, Olivia ; Jinschek, Joerg ; Fink, Carolin
in: Microscopy and Microanalysis, vol: 28, issue: S1, pages: 2088-2090
Presented at: Microscopy & Microanalysis 2022

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2022 | DOI: https://doi.org/10.1017/S143192762200808X

In situ TEM Observations of Thermally Activated Phenomena in Materials Under Far-From-Equilibrium Conditions

Vijayan, Sriram ; Bawane, Kaustubh ; Giulia Dilemma, Fidelma ; He, Lingfeng ; Fink, Carolin ; Jinschek, Joerg R
in: Microscopy and Microanalysis, vol: 28, issue: S1, pages: 1844-1846
Presented at: Microscopy & Microanalysis 2022

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2022 | DOI: https://doi.org/10.1017/S1431927622007255

(Invited) Selenium as a Top-Cell Absorber Candidate for Tandem Photoelectrochemical Stacks

Nielsen, Rasmus ; Youngman, Tomas ; Crovetto, Andrea ; Seger, Brian ; Hansen, Ole ; Mustafa, Hadeel ; Levcenco, Sergiu ; Hempel, Hannes ; Olsen, Thomas ; Chorkendorff, Ib ; Unold, Thomas ; Vesborg, Peter
part of: ECS Meeting Abstracts, 2022

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published | Year: 2022 | DOI: https://doi.org/10.1149/MA2022-02481802mtgabs

Probing Atom Dynamics in Excited Nanocrystals

Chen, Fu-Rong ; Van dyck, Dirk ; Kisielowski, Christian ; Barton, Bastian ; Hansen, Lars P. ; Helveg, Stig
in: Microscopy and Microanalysis, vol: 28, issue: S1, pages: 2128-2129

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2022 | DOI: https://doi.org/10.1017/S1431927622008248

A new generic method to extract stoichiometric and dynamic information from the exit-wave for thin sample

Van Dyck, Dirk ; Home, Fu-Rong ; Kisielowski, Christian ; Helveg, Stig
in: Microscopy and Microanalysis, vol: 27, issue: suppl.1, pages: 2314-2316

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2021 | DOI: https://doi.org/10.1017/S1431927621008321

Observing atomic resolution dynamics of soft materials with controlling dose rate

Chen, Fu-Rong ; Van Dyck, Dirk ; Kisielowski, Christian ; Helveg, Stig
in: Microscopy and Microanalysis, vol: 27, issue: suppl.1, pages: 2124-2126

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2021 | DOI: https://doi.org/10.1017/S1431927621007662

Reconstructing the exit wave in high-resolution transmission electron microscopy using machine learning

Schiøtz, Jakob ; Dahl, Frederik ; Larsen, Matthew Helmi Leth ; Kisielowski, Christian ; Helveg, Stig ; Winther, Ole ; Hansen, Thomas
in: Microscopy and Microanalysis, vol: 27, issue: suppl.1, pages: 254-256

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2021 | DOI: https://doi.org/10.1017/S1431927621001495

Superior Neural Network for Distinguishing Between Atomic Species

Larsen, Matthew Helmi Leth ; Lomholdt, William Bang ; Dreisig, Anders Siig ; Helveg, Stig ; Winther, Ole ; Hansen, Thomas ; Schiøtz, Jakob
in: Microscopy and Microanalysis, vol: 27, issue: S1, pages: 466-468
Presented at: Microscopy and Microanalysis 2021

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2021 | DOI: https://doi.org/10.1017/S1431927621002166

Building an All-Sulfide TaS₂/Cu₂-II-Sn-S₄/CdS Solar Cell and Putting it on Silicon

Crovetto, Andrea ; Assar, Alireza ; Nielsen, Rasmus ; Hansen, Ole ; Seger, Brian ; Chorkendorff, Ib ; Vesborg, Peter
Presented at: American Physical Society March Meeting 2020

Type: Poster (Peer reviewed)

Status: Published | Year: 2020

Publikationer